Infrared Ellipsometry on Semiconductor Layer Structures

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Focusing on semiconductor-layer structures, this book delves into the principles of phonons, plasmons, and polaritons, alongside the infrared dielectric function of semiconductors. It explores how factors like strain, composition, and atomic order in multinary alloys can be analyzed through infrared ellipsometry. The text emphasizes the properties of free-charge carriers and discusses magneto-optical effects, making it a valuable resource for understanding advanced optical spectroscopy techniques in semiconductor research.