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- 689 Seiten
- 25 Lesestunden
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This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.
Buchkauf
Scanning Electron Microscopy and X-Ray Microanalysis, Joseph I. Goldstein, Dale E. Newbury, David C Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda C. Sawyer, J.R. Michael
- Sprache
- Erscheinungsdatum
- 2003
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- Gebraucht - Gut
- Preis
- € 16,49
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- Untertitel
- Third Edition
- Sprache
- Englisch
- Autor*innen
- Joseph I. Goldstein, Dale E. Newbury, David C Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda C. Sawyer, J.R. Michael
- Verlag
- Springer
- Erscheinungsdatum
- 2003
- Einband
- Hardcover
- Seitenzahl
- 689
- ISBN10
- 0306472929
- ISBN13
- 9780306472923
- Reihe
- Schlagwörter
- Sachbücher, Lehrbücher, Technologie & Industrie, Medizin & Gesundheit, Wissenschaft & Mathematik, Sonstige Lehrbücher, Handbücher und Anleitungen, Medizinstudium
- Beschreibung
- This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.